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Application of metallic materials for selective growth
Němeček, Tomáš ; Rezek, Bohuslav (referee) ; Čechal, Jan (advisor)
The Si(100) surface and Ga surface phases up to 1 ML on their oxidation have been studied by XPS and LEED. The selective growth of Ga on the SiO2/Si structures fabricated by EBL has been analyzed using SEM and AFM methods. It was proved that Ga clusters grow in structures beside the oxide. The structure of alumina on Ni3Al(111) and NiAl(110) substrates was fully determined by combining the results of STM measurements and DFT simulations. It was determined the alumina/NiAl(110) does not form a suitable template for ordered Fe and Co clusters growth. However, the next research confirmed the alumina/Ni3Al(111) forms template appropriate to clusters growth purpose.
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Selective gallium nitride thin-film growth on substrates covered by pyrolyzed resist mask
Novák, Tomáš ; Kostelník, Petr (referee) ; Voborný, Stanislav (advisor)
This thesis deals with deposition of GaN thin films and GaN selective growth utilizing pyrolyzed resist masks. Carbon masks were prepared on silicon substrates by electron-beam litography and resist pyrolysis. As a further step, Ga and GaN were deposited on the masked substrates by Moleculer Beam Epitaxy (MBE) method. A selective growth of Ga droplets was achieved. These results were used for preparation of GaN crystallites by pulse deposition. It is also shown that direct MBE deposition of GaN on the masked substrates leads to a selective growth of GaN thin films with GaN film growing only on the areas which are not covered by the carbon mask. The results are explained by enhanced surface diffusion of gallium atoms on the surface of the carbon mask.
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Application onf the Focused Ion on Electron Beam in Nanotechnologies
Šamořil, Tomáš ; Mikulík, Petr (referee) ; Jiruše, Jaroslav (referee) ; Šikola, Tomáš (advisor)
Nowadays, the systems that allow simultaneous employment of both focused electron and ion beams are very important tools in the field of micro- and nanotechnology. In addition to imaging and analysis, they can be used for lithography, which is applied for preparation of structures with required shapes and dimensions at the micrometer and nanometer scale. The first part of the thesis deals with one lithographic method – focused electron or ion beam induced deposition, for which a suitable adjustment of exposition parameters is searched and quality of deposited metal structures in terms of shape and elemental composition studied. Subsequently, attention is paid also to other types of lithographic methods (electron or ion beam lithography), which are applied in preparation of etching masks for the subsequent selective wet etching of silicon single crystals. In addition to optimization of mentioned techniques, the application of etched silicon surfaces for, e.g., selective growth of metal structures has been studied. The last part of the thesis is focused on functional properties of selected 2D or 3D structures.
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Selective growth of GaN on SiN
Hulva, Jan ; Kolíbal, Miroslav (referee) ; Mach, Jindřich (advisor)
This bachelor's thesis deals with the selective growth of gallium and gallium nitride on silicon nitride (SiN) substrates. Thin silicon nitride layers are deposited on silicon substrates. Oxide structures are prepared by the local anodic oxidation method (LAO) on SiN substrates. These surfaces can be editionally modified by etching in hydrofluoric acid. Modified substrates are used for the deposition of gallium or gallium nitride under ultra-high vacuum conditions. Consequently, ordering of deposited material was studied in areas modified by LAO. Chemical state of layers is studied by X-ray photoelectron spectroscopy. Morphology of surfaces is measured by the atomic force microscope (AFM).
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Selective growth of GaN layers on substrate modificated by method FIB
Mareš, Petr ; Voborný, Stanislav (referee) ; Mach, Jindřich (advisor)
The thesis deals with the selective growth of GaN crystals on the SiO2 layer. The theoretical part discusses the type of growth of ultrathin layers with focus on gallium nitride and its manufacturing. Moreover the text deals with principles of the focused ion beam and basic principles of other further methods which were used for analyzing the samples (AFM, XPS, photoluminescence spectroscopy). Experimental part consists of depositions of GaN. The silicon wafer Si(111) with native oxide SiO2 (1-2 nm) was used as a substrate. Focused ion beam was utilized to manufacture suitable structures on the substrate. Selective growth was acomplished with the use of the postnitridation method. Method of the pulse deposition was introduced with focus on increasing the volume of crystals.
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Sequential growth of GaN nanocrystals on SiO2 substrate modified by FIB method
Flajšmanová, Jana ; Voborný, Stanislav (referee) ; Mach, Jindřich (advisor)
This bachelor's thesis deals with the selective growth of gallium (Ga) and gallium nitride (GaN). In theoretical part, there is a brief description of growth of ultrathin films with respect to GaN and their manufacturing. Experimental part is aimed to the deposition of Ga and GaN on silicon substrates Si(1 1 1). Substrates with the native silicon dioxide layer (SiO2) were modified by focused ion beam (FIB). GaN was deposited by pulsed deposition followed by postnitridation. Prepared samples were studied by atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS) and scanning electron microscope (SEM).
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Application onf the Focused Ion on Electron Beam in Nanotechnologies
Šamořil, Tomáš ; Mikulík, Petr (referee) ; Jiruše, Jaroslav (referee) ; Šikola, Tomáš (advisor)
Nowadays, the systems that allow simultaneous employment of both focused electron and ion beams are very important tools in the field of micro- and nanotechnology. In addition to imaging and analysis, they can be used for lithography, which is applied for preparation of structures with required shapes and dimensions at the micrometer and nanometer scale. The first part of the thesis deals with one lithographic method – focused electron or ion beam induced deposition, for which a suitable adjustment of exposition parameters is searched and quality of deposited metal structures in terms of shape and elemental composition studied. Subsequently, attention is paid also to other types of lithographic methods (electron or ion beam lithography), which are applied in preparation of etching masks for the subsequent selective wet etching of silicon single crystals. In addition to optimization of mentioned techniques, the application of etched silicon surfaces for, e.g., selective growth of metal structures has been studied. The last part of the thesis is focused on functional properties of selected 2D or 3D structures.
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Selective gallium nitride thin-film growth on substrates covered by pyrolyzed resist mask
Novák, Tomáš ; Kostelník, Petr (referee) ; Voborný, Stanislav (advisor)
This thesis deals with deposition of GaN thin films and GaN selective growth utilizing pyrolyzed resist masks. Carbon masks were prepared on silicon substrates by electron-beam litography and resist pyrolysis. As a further step, Ga and GaN were deposited on the masked substrates by Moleculer Beam Epitaxy (MBE) method. A selective growth of Ga droplets was achieved. These results were used for preparation of GaN crystallites by pulse deposition. It is also shown that direct MBE deposition of GaN on the masked substrates leads to a selective growth of GaN thin films with GaN film growing only on the areas which are not covered by the carbon mask. The results are explained by enhanced surface diffusion of gallium atoms on the surface of the carbon mask.
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